第303回応用セラミックス研究所講演会 (Dr. Scott Speakma)

プログラム等

講師： Dr. Scott Speakma
　　　　(Principal Scientist　(PANalytical Inc.))

講演テーマ： In-situ Diffraction Analysis using Quantitative Rietveld Refinement

アブストラクト:
　Rietveld refinement is a powerful tool for quantitative analysis of X-ray and neutron diffraction data. Research can benefit from the quantification of phase composition, quantification of nanocrystallite size, or refinement of the atomic crystal structure that is accomplished using Rietveld refinement. This presentation will review the fundamental concepts of diffraction for novice users and then introduce the advanced concepts of Rietveld refinement. Case studies will be presented showing the use of Rietveld refinement for studying phase transformations of ionic conducting ceramics; time-resolved reactions of hydrogen storage materials; coarsening of catalytic nanoparticles; and synthesis of nanocrystalline scintillations materials. Students will leave the presentation with an understanding of the capabilities and limitations of in-situ diffraction when combined with Rietveld refinement and the potential benefits for their own research.

講師のプロファイル:
　Dr. Scott Speakman is a Principal Scientist for PANalytical Inc. Prior to joining PANalytical, Dr. Speakman managed the X-ray Shared Experimental Facility at MIT. Dr. Speakman earned his PhD from Alfred University and served as a post-doctoral research associate with the Diffraction and Thermophysical Properties group at Oak Ridge National Lab. Dr. Speakman is a Fellow of the International Center for Diffraction Data, the chairperson for the ICDD subcommittee on Micro- and Meso-Porous Materials, and was awarded a 2013 Infinite Mile Award for extraordinary service to MIT.